作者Jin, Eric Nuokai
ProQuest Information and Learning Co
Yale University
書名Band Offset Engineering and Integration of High Electron Density Oxides with Conventional Semiconductors
出版項2018
說明1 online resource (198 pages)
文字text
無媒介computer
成冊online resource
附註Source: Dissertations Abstracts International, Volume: 80-02, Section: B
Publisher info.: Dissertation/Thesis
Advisor: Ahn, Charles H
Thesis (Ph.D.)--Yale University, 2018
Includes bibliographical references
Thin film crystalline oxides exhibit a wide variety of interesting physical phenomena, including superconductivity and switchable magnetism. One material of interest in the complex oxide community is the RTiO 3/SrTiO3 (RTO/STO) system, where R is a trivalent rare-earth element such as La (LTO) or Gd (GTO). It was discovered that a 2-dimensional electron gas (2DEG) forms at the interface of these otherwise insulating oxides, supporting a carrier concentration of ̃3 x 1014 cm-2. This charge density is an order of magnitude higher than what is achievable in state-of-the-art III-N semiconductor systems, but devices made with these oxides tend to have poor electron mobility at room temperature. We demonstrate an approach toward realizing high mobility and high carrier concentration devices by the epitaxial integration of single crystalline LTO/STO and GTO/STO structures onto silicon by molecular beam epitaxy. The effect of doping the STO films with La to realize a high carrier concentration is also studied, and electrical characterization shows that high 2DEG densities are found in each system. One challenge to achieving high mobility is an unfavorable band alignment between STO and Si, which we show by x-ray photoemission spectroscopy to be a staggered (type II) gap. The Si conduction band is positioned ̃0.7 eV higher than the STO conduction band and thus confines the electrons to the low mobility oxide. We demonstrate that by increasing the oxygen content at the interface, the conduction band offset can be reduced to nearly zero, improving the number of carriers in the silicon, which we quantify with a dual channel conduction model. This approach provides a route toward remotely doping semiconductors by band offset engineering and also serves as an example of combining multifunctional complex oxides with conventional semiconductor technology
Electronic reproduction. Ann Arbor, Mich. : ProQuest, 2019
Mode of access: World Wide Web
主題Applied physics
Condensed matter physics
Materials science
Electronic books.
0215
0611
0794
ISBN/ISSN9780438193765
QRCode
相關連結: click for full text (PQDT) (網址狀態查詢中....)
館藏地 索書號 條碼 處理狀態  

Go to Top