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標題 (1-3 之 3)
Secondary ion mass spectrometry
1 Cluster secondary ion mass spectrometry [electronic resource] : principles and applications / editedMahoney, Christine M., 1975- Hoboken, NJ : John Wiley and Sons, c2013 相關連結
c2013
   
2 An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to Fearn, Sarah, author San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Morgan & Claypool Publishers, [2015] 相關連結
2015
   
3 Secondary ion mass spectrometry [electronic resource] : an introduction to principles and practices Van der Heide, Paul, 1962- Hoboken, New Jersey : John Wiley & Sons, Inc., 2014 相關連結
2014
   

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